Measurement Services

Avian Technologies offers NIST/NRC traceable measurement services for both regular (near normal) and total hemispherical reflectance over the 250-2500 nm range. Regular transmittance measurements, also traceable to NIST/NRC, over the same range are also available. We provide 45:0 radiance factor measurements over the range 380-720 nm.

Goniospectrophotometric measurements are also available over the range of 390-730 nm employing our Murakami GSP-1 goniospectrophotometer.

We at Avian Technologies pride ourselves in the quick turnaround of highly accurate and traceable measurements, typically within one week of receiving samples. Many measurement projects require non-standard geometries, which generally means that formal traceability is either not possible or not economically practical. For customers requiring such work, we will refer you to our close affiliates, Avian Rochester, LLC. The Avian Rochester team maintains or has access to a wide variety of flexible instrumentation, and should be able to meet every customized measurement need – including yours.

We offer several standard and custom measurement services. In all cases, there is a fixed setup fee, which includes instrument set up, calibration, verification, and documentation. In addition, quantity discounts are available, the breakdown is typically one fee for 1-5 samples, 6-10 samples, and 11-20 samples. For more than 20 samples, we will negotiate individually. For custom measurement services the above schedule will apply, but pricing for each job will individually determined.

Standard measurement geometries include:

Diffuse & Regular Reflectance
Diffuse (UV-Vis)
Diffuse (UV-Vis-NIR)
Regular Reflectance
Diffuse & Regular Transmittance
Regular (UV-Vis)
Regular (UV-Vis-NIR)
Diffuse Transmittance (scattering transmittance are not traceable)
Bidirectional Reflectance (45:0)
Goniospectrophotometric Measurements (Reflectance vs angle)
Diffuse/Normal Measurements

All data is reported as hard copy in either 10 or 25 nm increments and on CD-ROM (Microsoft Excel or tab delimited format) at 1 nm (UV-Vis) or 5 nm (UV-Vis-NIR) increments. Graphical data is presented. All samples are double or triple scanned and averaged.

Calibration of wavelength calibration standards (rare earth oxide tiles, thermoplastics, or glass) are reported for peaks of lowest transmittance (maximum absorbance) to 0.1 nm. Samples are run at a 1nm bandpass in the UV-Vis and approximately 4 nm in the NIR. Rates are the same as those for diffuse reflectance or regular transmittance.

A set up fee is changed on each new order. If a customer contracts for multiple samples to be run over a period of time, the set up fee may be waived after the initial fee.

Contract measurements are available.